Research of different structure integrated photodetectors in standard CMOS technology
- Author(s):
- Publication title:
- Optoelectronic devices and integration II : 12-15 November 2007, Beijing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6838
- Pub. Year:
- 2008
- Page(from):
- 68381O-1
- Page(to):
- 68381O-7
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819470133 [0819470139]
- Language:
- English
- Call no.:
- P63600/6838
- Type:
- Conference Proceedings
Similar Items:
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
Research on structural properties of ZnO thin films deposited on different substrates
Society of Photo-optical Instrumentation Engineers |
2
Conference Proceedings
Simulation and design of Si double-photodetector for monolithic OEIC in standard CMOS technology [6020-110]
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
The research on the photo-electronic integrated acceleration seismic detecting technology
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
9
Conference Proceedings
31 New Materials, Processes and Device Structures for 65nm CMOS Technology Node and Beyond
Electrochemical Society |
Trans Tech Publications |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
6
Conference Proceedings
Simulation of InP-based monolithically integrated PIN-HEMT front-end optical receiver
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Influence of Plasma Arc Melting on Melt Structure and Solidification Microstructure of Al-16 wt.% Si Alloy
Trans Tech Publications |