Study of uncooled thermal imaging system with multiple working temperatures
- Author(s):
- Publication title:
- Infrared materials, devices, and applications : 12-15 November 2007, Beijing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6835
- Pub. Year:
- 2008
- Page(from):
- 683520-1
- Page(to):
- 683520-8
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819470102 [0819470104]
- Language:
- English
- Call no.:
- P63600/6835
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Study of uncooled thermal imaging system with multiple working temperatures
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
The nonuniformity measurement and image processing algorithm evaluation for uncooled microbolometer infrared focal plane arrays
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Interaction between parameters of 320X240 pixels uncooled microbolometer array detector [6352-129]
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Caluculation for effects of temperature fluctuation noise on NETD in uncooled infrared thermal imaging system
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Performance analysis of low-cost uncooled microbolometer infrared detectors [6352-126]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Analysis and measurement of thermal-electrical performance of microbolometer detector
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |