Design of intelligent fault diagnosis system for photoelectric tracking devices based on virtual technology

Design of intelligent fault diagnosis system for photoelectric tracking devices based on virtual technology

Author(s):

M. Hou ( Institute of Optics and Electronics, China )
Q. Wu ( Institute of Optics and Electronics, China )
Y. Liu ( Institute of Optics and Electronics, China )
Q. Chen ( Institute of Optics and Electronics, China )

Publication title:

Electronic imaging and multimedia technology V

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6833

Pub. Year:

2008

Vol.:

2

Page(from):

68332M-1

Page(to):

68332M-9

Pages:

9

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819470089 [0819470082]

Language:

English

Call no.:

P63600/6833

Type:

Conference Proceedings

Details

TDL ID:	ZA00052464
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Electronic Imaging and Multimedia Technology
Conf. info. (Number):	2007 : 5th
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2007.11.12-2007.11.15
Note for article:	Electronic imaging and multimedia technology V, 12-15 November 2007, Beijing, China - Poster Session (68332M/6833-82)

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