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Bare wafer metrology challenges in microlithography at 45-nm node and beyond

Author(s):
C. Huang ( KLA-Tencor Corp., USA )  
Publication title:
Quantum optics, optical data storage, and advanced microlithography : 12-14 November 2007, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6827
Pub. Year:
2008
Pt.:
C
Page(from):
682723-1
Page(to):
682723-15
Pages:
15
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470027 [0819470023]
Language:
English
Call no.:
P63600/6827
Type:
Conference Proceedings

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