Blank Cover Image

Functional minimization problems in image processing

Author(s):
  • Y. Kim ( Univ. of California, Los Angeles, USA )
  • L. A. Vese ( Univ. of California, Los Angeles, USA )
Publication title:
Computational imaging VI : 28-29 January, 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6814
Pub. Year:
2008
Page(from):
68140Q-1
Page(to):
68140Q-11
Pages:
11
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469861 [0819469866]
Language:
English
Call no.:
P63600/6814
Type:
Conference Proceedings

Similar Items:

C. Elion, L. A. Vese

SPIE - The International Society of Optical Engineering

Edgar, T. F., Huang, Y. L.

American Chemical Society

Stotland,l., Kim,D., Kim,Y.

SPIE - The International Society for Optical Engineering

8 Conference Proceedings Engineering Risk Analysis

Vesely E. W.

Martinus Nijhoff Publishers

Chung, G., Le, T. M., Lieu, L. H., Tanushev, N. M., Vese, L. A.

SPIE - The International Society of Optical Engineering

VESELY, E. J.

American Institute of Chemical Engineers

Hopper, J. R., Yaws, C. L., Ho, T. C., Vichailak, M.

American Institute of Chemical Engineers

W. Vesely

ESA Communication Production Office

A. Chambolle, P.-L. Lions

Society of Photo-optical Instrumentation Engineers

W. Vesely

ESA Communication Production Office

K. Lee, J. Heo, K. Ban, H. Seo, G. Lee, W. Kim, J. Cho, J. Sun, S. Lee, C. Bok, S. Moon, J. Kim

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12