A color image quality assessment using a reduced-reference image machine learning expert

A color image quality assessment using a reduced-reference image machine learning expert

Author(s):

C. Charrier ( Univ. de Caen Basse-Normandie, CNRS, France )
G. Lebrun ( Univ. de Caen Basse-Normandie, CNRS, France )
O. Lezoray ( Univ. de Caen Basse-Normandie, CNRS, France )

Publication title:

Image quality and system performance V : 28-30 January 2008, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6808

Pub. Year:

2008

Page(from):

68080U-1

Page(to):

68080U-12

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819469809 [0819469807]

Language:

English

Call no.:

P63600/6808

Type:

Conference Proceedings

Details

TDL ID:	ZA00052439
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Image Quality and System Performance
Conf. info. (Number):	2008 : 5th
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2008.01.28-2008.01.30
Note for article:	Image quality and system performance V, 28-30 January 2008, San Jose, California, USA - Session 6. Systems Performance: Modeling (6808-25)

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