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Characterization of reflection scanner uniformity

Author(s):
Publication title:
Image quality and system performance V : 28-30 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6808
Pub. Year:
2008
Page(from):
680803-1
Page(to):
680803-8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469809 [0819469807]
Language:
English
Call no.:
P63600/6808
Type:
Conference Proceedings

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