Blank Cover Image

INCITS W1 .1 development update: appearance-based image quality standards for printers

Author(s):
E. K. Zeise ( Eastman Kodak Co., USA )
D. R. Rasmussen ( Xerox Corp., USA )
Y. S. Ng ( Eastman Kodak Co., USA )
E. Dalal ( Xerox Corp., USA )
A. McCarthy ( Lexmark Corp., USA )
D. Williams ( Image Science Associates, USA )
1 more
Publication title:
Image quality and system performance V : 28-30 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6808
Pub. Year:
2008
Page(from):
680802-1
Page(to):
680802-10
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469809 [0819469807]
Language:
English
Call no.:
P63600/6808
Type:
Conference Proceedings

Similar Items:

T. Bouk, E. N. Dalal, K. D. Donohue, S. Farnand, F. Gaykema, D. Gusev, A. Haley, P. L. Jeran, D. Kozak, W. C. Kress, O. …

SPIE - The International Society of Optical Engineering

Ng, Y.S., Cui, L.C., Kuo, C.-H., Maggard, E., Mashtare, D., Morris, P., Viola, M.

SPIE - The International Society of Optical Engineering

Cookingham, R., Dalal, E.N., Farnand, S., Gusev, D., Kress, W.C., Martinez, O., McCarthy, A., Topfer, K., Zeise, E.K.

SPIE - The International Society of Optical Engineering

Dalal, E.N., Haley, A., Robb, M., Briggs, J.C., Mashtare, D., Jeran, P.L., Bouk, T.

SPIE - The International Society of Optical Engineering

Y. S. Ng, C. Kuo, E. Maggard, D. Mashtare, P. Morris, S. Farnand

SPIE - The International Society of Optical Engineering

9 Conference Proceedings RADARSAT- I Image Quality - Update

Srivastava, S.K., Banik, B.T., Adamovic, M., Gray, R., Hawkins, R.K., Lukowski, T.I., Murnaghan, K.P., Jefferies, W.C.

ESA Publications Division

Farnand, S., Topfer, K., Kress, W. C., Martinez, O., McCarthy, A. L., Shin, H. H., Zeise, E. K., Gusev, D.

SPIE - The International Society of Optical Engineering

D. R. Rasmussen

Society of Photo-optical Instrumentation Engineers

Zeman, R.E., Kress, W.C., Rasmussen, D.R., Zeise, E.K., Chiu, G., Donohue, K.D., Hertel, D.

SPIE - The International Society of Optical Engineering

E. K. Zeise, W. C. Kress, D. R. Williams

Society of Photo-optical Instrumentation Engineers

6 Conference Proceedings INCITS W1.1 macro-uniformity

Rasmussen, D.R., Kress, W.C., Ng, Y.S., Doyle, M., Donohue, K.D., Johnson, K., Zoltner, S.

SPIE - The International Society of Optical Engineering

Shin, H.H., Dalal, E.N., Rasmussen, D.R.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12