Blank Cover Image

Vibration evaluation of nonlinear system under random parametric excitations by probabilistic method

Author(s):
  • S.-Y. Lee ( Kunsan National Univ., South Korea )
  • G. Cai ( Florida Atlantic Univ., USA )
Publication title:
ICMIT 2007, mechatronics, MEMS, and smart materials
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6794
Pub. Year:
2008
Vol.:
2
Page(from):
67943A-1
Page(to):
67943A-6
Pages:
6
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469595 [0819469599]
Language:
English
Call no.:
P63600/6794
Type:
Conference Proceedings

Similar Items:

Cheng,G., Mei,C., Lee,R.

American Institute of Aeronautics and Astronautics

C.W.S. To, M.L. Liu

American Society of Mechanical Engineers

Chung Hwan Kim, Chong-Won Lee, N. C. Perkins

American Society of Mechanical Engineers

Scarpa, F.L., Ruzzene, M., Hassan, M.R.

SPIE - The International Society of Optical Engineering

Oueini,S.S., Nayfeh,A.H.

SPIE-The International Society for Optical Engineering

Cardoni, A., Lucas, M., Cartmell, M.P., Lim, F.C.N.

Trans Tech Publications

Sun, Zuo Yu, Wang, Hui, Zhang, Yong Shan, Yan, Le Wei

Trans Tech Publications

Z.J. Li, X.J. Yang, G.W. Cai, X.S. Liu

Trans Tech Publications

Worden,K., Manson,G.

Society for Experimental Mechanics

Worden,K.

Society for Experimental Mechanics

Rubin Wang, Kimihiko Yasuda

American Society of Mechanical Engineers

McClay III, W. A., Awwal, A. A. S., Jones, H. E., Wilhelmsen, K. C., Ferguson, W., McGee, M., Miller, M. G.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12