Optimal exposure estimation in the image for structured light system
- Author(s):
- Publication title:
- ICMIT 2007, mechatronics, MEMS, and smart materials
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6794
- Pub. Year:
- 2008
- Vol.:
- 1
- Page(from):
- 679419-1
- Page(to):
- 679419-6
- Pages:
- 6
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819469595 [0819469599]
- Language:
- English
- Call no.:
- P63600/6794
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Simulation analysis of backside defects printability in 193nm photolithography
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Capability of eco-friendly cleaning strategy corresponding to advanced technology
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
9
Conference Proceedings
Convergence of optical spectroscopic system for characterization of InGaN/GaN multi-quantum well light-emitting diodes
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Design of illumination aperture for ArF exposure system with wide exposing latitude
SPIE - The International Society for Optical Engineering |
10
Conference Proceedings
Tailoring of isolation structures with top-surface imaging process by silylation
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
A Study on the Simplified Coupling System of the Cavity and the Structure of a Passenger Vehicle
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Novel cleaning techniques to achieve defect-free photomasks for sub-65-nm nodes [6349-109]
SPIE - The International Society of Optical Engineering |