New alignment marks for improved measurement maturity
- Author(s):
- U. Weidenmueller ( Vistec Electron Beam GmbH, Germany )
- H. Alves ( Vistec Electron Beam GmbH, Germany )
- B. Schnabel ( Vistec Electron Beam GmbH, Germany )
- B. Icard ( CEA-LETI. MINATEC, France )
- L. Pain ( CEA-LETI. MINATEC, France )
- Publication title:
- EMLC 2008 : 24th European Mask and Lithography Conference : 21-24 January 2008, Dresden, Germany
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6792
- Pub. Year:
- 2008
- Page(from):
- 679211-1
- Page(to):
- 679211-7
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819469564 [0819469564]
- Language:
- English
- Call no.:
- P63600/6792
- Type:
- Conference Proceedings
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