Research on reliability of carrier ethernet

Research on reliability of carrier ethernet

Author(s):

X. Wu ( Huazhong Univ. of Science and Technology, China )
Z. Yang ( Hugzhong Univ. of Science and Technology, China )

Publication title:

Network architectures, management, and applications V

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6784

Pub. Year:

2007

Vol.:

1

Page(from):

678408-1

Page(to):

678408-8

Pages:

8

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819469472 [0819469475]

Language:

English

Call no.:

P63600/6784

Type:

Conference Proceedings

Details

TDL ID:	ZA00052416
Series ID:	PA00000029
Conf. info. (Name):	Asia Communications and Photonics : Network Architectures, Management, and Applications
Conf. info. (Number):	2007 : 5th
Conf. info. (Venue):	Wuhan, China
Conf. info. (Date):	2007.11.02-2007.11.05
Note for article:	Network architectures, management, and applications V, 2-5 November 2007, Wuhan, China - Carrier Ethernet (6784-12)

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