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Analysis and measurement of thermal-electrical performance of microbolometer detector

Author(s):
  • L. Sun ( Nanjing Univ. of Science and Technology, China )
  • B. Chang ( Nanjing Univ. of Science and Technology, China )
  • J. Zhang ( Nanjing Univ. of Science and Technology, China )
  • Y. Qiu ( Nanjing Univ. of Science and Technology, China )
  • Y. Qian ( Nanjing Univ. of Science and Technology, China )
Publication title:
Optoelectronic materials and devices II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6782
Pub. date:
2007
Vol.:
2
Page(from):
678231-1
Page(to):
678231-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469458 [0819469459]
Language:
English
Call no.:
P63600/6782
Type:
Conference Proceedings

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