Photovoltaic effect of different thickness vanadium oxide thin film
- Author(s):
- X. Wei ( Univ. of Electronic Science and Technology of China, China )
- Z. Wu ( Univ. of Electronic Science and Technology of China, China )
- T. Wang ( Univ. of Electronic Science and Technology of China, China )
- S. Li ( Univ. of Electronic Science and Technology of China, China )
- J. Tang ( Univ. of Electronic Science and Technology of China, China )
- Publication title:
- Optical test and measurement technology and equipment
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6723
- Pub. Year:
- 2007
- Vol.:
- 2
- Page(from):
- 672342-1
- Page(to):
- 672342-5
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819468802 [0819468800]
- Language:
- English
- Call no.:
- P63600/6723
- Type:
- Conference Proceedings
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