Blank Cover Image

Design of new-style integrated verification device for optical theodolites

Author(s):
  • X. Guo ( Xi'an Research Institute of High-tech, China )
  • Z. Zhu ( Xi'an Research Institute of High-tech, China )
  • H. Wu ( Xi'an Research Institute of High-tech, China )
  • L. Ding ( Xi'an Research Institute of High-tech, China )
Publication title:
Optical test and measurement technology and equipment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6723
Pub. date:
2007
Vol.:
1
Page(from):
67231L-1
Page(to):
67231L-6
Pages:
6
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819468802 [0819468800]
Language:
English
Call no.:
P63600/6723
Type:
Conference Proceedings

Similar Items:

Z. Zhu, X. Guo, H. Ding, L. Ding

Society of Photo-optical Instrumentation Engineers

Zhu,X., Wu,S., Jing,H., Ling,X.Shao,Z., Huang,X.M.

SPIE - The International Society for Optical Engineering

Zhao H., Guo L.

SPIE - The International Society of Optical Engineering

Yamada, S., Cai, T. M., Shi, R. F., Wu, M. H., Chen, W. D., Qian, Q. M., Garito, A. F.

MRS - Materials Research Society

J. Zhu, P. Wu, Q. Wu, H. Ding, X. Li, C. Sun

SPIE - The International Society of Optical Engineering

H. Ding, X. Wu, J. Liang

Society of Photo-optical Instrumentation Engineers

Chen, C.H., Wu, B., Ding, L., Cui, Y.M.

SPIE-The International Society for Optical Engineering

Wu, G., Guo, H., Zeng, X., Ding, W.

Trans Tech Publications

Z. Zhang, J. Zhu, H. Zhou, S. Ye

Society of Photo-optical Instrumentation Engineers

Wu, P., Liu, X., Ye, H., Yang, L., Yang, H.

SPIE - The International Society of Optical Engineering

H. Yang, X. Chen, Z. Gao

Society of Photo-optical Instrumentation Engineers

Liu,X., Wang,L., Luo,H., Liu,W., Wu,X.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12