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Phase transition characteristics of tungsten and tantalum doped VO2 polycrystalline thin films formed by ion beam enhanced deposition

Author(s):
  • J. Li ( Jiangsu Polytechnic Univ., China )
  • D. Dan ( Jiangsu Polytechnic Univ., China )
  • N. Yuan ( Jiangsu Polytechnic Univ., China )
  • T. Xie ( Jiangsu Polytechnic Univ., China )
Publication title:
Optical test and measurement technology and equipment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6723
Pub. date:
2007
Vol.:
1
Page(from):
672310-1
Page(to):
672310-5
Pages:
5
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819468802 [0819468800]
Language:
English
Call no.:
P63600/6723
Type:
Conference Proceedings

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