Drift analysis for integer IDCT

Drift analysis for integer IDCT

Author(s):

A. T. Hinds ( InfoPrint Solutions Co. (USA) )
Y. A. Reznik ( Qualcomm Inc. (USA) )
L. Yu ( Zhejiang Univ. (China) )
Z. Ni ( Zhejiang Univ. (China) )
C. Zhang ( Zhejiang Univ. (China) )

Publication title:

Applications of digital image processing XXX

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6696

Pub. Year:

2007

Vol.:

2

Page(from):

669614-1

Page(to):

669614-16

Pages:

16

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468444 [0819468444]

Language:

English

Call no.:

P63600/6696

Type:

Conference Proceedings

Details

TDL ID:	ZA00052343
Series ID:	PA00000029
Conf. info. (Name):	SPIE Optical Engineering and Applications : Applications of Digital Image Processing
Conf. info. (Number):	2007 : 30th
Conf. info. (Venue):	San Diego, California, USA
Conf. info. (Date):	2007.08.28-2007.08.30
Note for article:	Applications of Digital Image Processing XXX, August 28-30, 2007, San Diego, CA, USA - Session 5. IDCT, Invited paper (6696-38)

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