Development of a Si:As blocked impurity band detector for far IR detection

Development of a Si:As blocked impurity band detector for far IR detection

Author(s):

D. S. Tezcan ( IMEC (Belgium) )
J. Putzeys ( IMEC (Belgium) )
K. De Munck ( IMEC (Belgium) )
T. Souverijns ( IMEC (Belgium) )
P. Merken ( IMEC (Belgium) )

Publication title:

Infrared systems and photoelectronic technology II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6660

Pub. Year:

2007

Page(from):

66600R-1

Page(to):

66600R-12

Pages:

12

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468086 [0819468088]

Language:

English

Call no.:

P63600/6660

Type:

Conference Proceedings

Details

TDL ID:	ZA00052319
Series ID:	PA00000029
Conf. info. (Name):	SPIE Organic Photonics and Electronics : Infrared Systems and Photoelectronic Technology
Conf. info. (Number):	2007 : 2nd
Conf. info. (Venue):	San Diego, California, USA
Conf. info. (Date):	2007.08.26-2007.08.28
Note for article:	Infrared systems and photoelectronic technology II, 26-28 August 2007, San Diego, CA, USA - Part A. Infrared Detectors and Focal Plane Arrays IX, Session 7. Silicon Technology (66600R)

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