Threshold segmentation using cultural algorithms for image analysis

Threshold segmentation using cultural algorithms for image analysis

Author(s):

Z. Pan ( South China Normal Univ. (China) )
L. Chen ( South China Normal Univ. (China) )
G. Zhang ( Sun Yat-sen Univ. (China) )

Publication title:

International Symposium on Photoelectronic Detection and Imaging 2007, related technologies and applications : 9-12 September 2007, Beijing China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6625

Pub. Year:

2008

Page(from):

662512-1

Page(to):

662512-8

Pages:

8

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819467676 [0819467677]

Language:

English

Call no.:

P63600/6625

Type:

Conference Proceedings

Details

TDL ID:	ZA00052305
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Photoelectronic Detection and Imaging 2007
Conf. info. (Number):	2007
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2007.09.09-2007.09.12
Note for article:	International Symposium on Photoelectronic Detection and Imaging 2007, 9-12 September 2007, Beijing, China (662512)

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