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Characteristics of ZnMgO-based metal-semiconductor-metal photodetectors

Author(s):
  • K. Liu ( Changchun Institute of Optics, Fine Mechanics and Physics (China) )
  • D. Shen ( Changchun Institute of Optics, Fine Mechanics and Physics (China) )
  • J. Zhang ( Changchun Institute of Optics, Fine Mechanics and Physics (China) )
  • Y. Lu ( Changchun Institute of Optics, Fine Mechanics and Physics (China) )
  • D. Jiang ( Changchun Institute of Optics, Fine Mechanics and Physics (China) )
Publication title:
International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6621
Pub. Year:
2008
Page(from):
662116-1
Page(to):
662116-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819467638 [0819467634]
Language:
English
Call no.:
P63600/6621
Type:
Conference Proceedings

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