Structural and Electrical Properties of LaNiO3 Thin Films Grown on (100) and (001) Oriented SrLaAlO4 Substrates by Chemical Solution Deposition Method

Structural and Electrical Properties of LaNiO₃ Thin Films Grown on (100) and (001) Oriented SrLaAlO₄ Substrates by Chemical Solution Deposition Method

Author(s):

D.S.L. Pontes ( Universidade Federal de São Carlos, São Carlos, Brazil )
F.M Pontes ( Universidade Estadual Paulista - Unesp, Bauru, Brazil )
Marcelo A. Pereira-da-Silva ( Institute of Physics of São Carlos, USP, São Carlos, Brazil )
O.M. Berengue ( Universidade Federal de São Carlos, São Carlos, Brazil )
A.J. Chiquito

Publication title:

Oxide semiconductors : symposium held December 1-6, 2013, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

1633

Pub. Year:

2014

Page(from):

25

Page(to):

33

Pages:

9

Pub. info.:

Warrendale, Pa: Materials Research Society

ISSN:

02729172

ISBN:

9781605116105 [1605116106]

Language:

English

Call no.:

M23500/1633

Type:

Conference Proceedings

Details

TDL ID:	ZA00052298
Series ID:	PA00000011
Conf. info. (Name):	Oxide Semiconductors
Conf. info. (Number):	2013
Conf. info. (Venue):	Boston, Massachusetts, U.S.A.
Conf. info. (Date):	2013.12.01-2013.12.06
Note for article:	2013 MRS Fall Meeting, Symposium R December 1-6, 2013, Boston, Massachusetts, USA ; Synthesis

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