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Carrier Lifetime Measurements by Photoconductance at Low Temperature on Passivated Crystalline Silicon Wafers

Author(s):
Publication title:
Film silicon science and technology : symposium held April 1-5, 2013, San Francisco, California U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
1536
Pub. Year:
2013
Page(from):
119
Page(to):
125
Pages:
7
Pub. info.:
Warrendale, Pa: Materials Research Society
ISSN:
02729172
ISBN:
9781605115139 [1605115134]
Language:
English
Call no.:
M23500/1536
Type:
Conference Proceedings

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