Effects of La0.5Sr0.5CoO3 sol Concentration on the Microstructure and Dielectric Properties of Ba0.6Sr0.4TiO3 Films Prepared by Sol-Gel Method on Ti Substrate

Effects of La_0.5Sr_0.5CoO₃ sol Concentration on the Microstructure and Dielectric Properties of Ba_0.6Sr_0.4TiO₃ Films Prepared by Sol-Gel Method on Ti Substrate

Author(s):

Dan Jiang ( Shanghai University, Shanghai, P.R. China )
Songwei Han
Xuelian Zhao
Jinrong Cheng

Publication title:

Oxide semiconductors and thin films : symposia held November 25-30, 2012, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

1494

Pub. Year:

2013

Page(from):

253

Page(to):

258

Pages:

6

Pub. info.:

Warrendale, Pa: Materials Research Society

ISSN:

02729172

ISBN:

9781605114712 [1605114715]

Language:

English

Call no.:

M23500/1494

Type:

Conference Proceedings

Details

TDL ID:	ZA00052284
Series ID:	PA00000011
Conf. info. (Name):	Oxide Semiconductors and Thin Films
Conf. info. (Number):	2012
Conf. info. (Venue):	Boston, Massachusetts, U.S.A.
Conf. info. (Date):	2012.11.25-2012.11.30
Note for article:	2012 MRS Fall Meeting, Symposium Z and Symposium F, November 25-30, 2012, Boston, Massachusett ; Non-ZnO oxides

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