Blank Cover Image

Grazing Incidence X-ray Topographic Studies of Threading Dislocations in Hydrothermal Grown ZnO Single Crystal Substrates

Author(s):
Publication title:
Oxide semiconductors and thin films : symposia held November 25-30, 2012, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
1494
Pub. Year:
2013
Page(from):
121
Page(to):
126
Pages:
6
Pub. info.:
Warrendale, Pa: Materials Research Society
ISSN:
02729172
ISBN:
9781605114712 [1605114715]
Language:
English
Call no.:
M23500/1494
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings X-ray Characterization of GaN Single Crystal Layers Grown by the Ammonothermal Technique on HVPE GaN Seeds and by the Sublimation Technique on Sapphire Seeds

Raghothamachar, Balaji, Dudley, Michael, Wang, Buguo, Callahan, Michael, Bliss, David, Konkapaka, Phanikumar, Wu, …

Materials Research Society
7 Conference Proceedings WHITE BEAM SYNCHOROTRON TOPOGRAPHIC STUDIES OF THE EFFECTS OF LOCALIZED STRESS FIELDS ON THE KINETICS OF SINGLE CRYSTAL SOLID STATE REACTIONS

Dudley, Michael

Materials Research Society
2 Conference Proceedings Structural Characterization of GaN Single Crystal Layers Grown by Vapor Transport From a Gallium Oxide (Ga2O3) Powder Source

Raghothamachar, Balaji, Konkapaka, Phanikumar, Wu, Huaqiang, Dudley, Michael, Spencer, Michael

Materials Research Society
8 Conference Proceedings Analysis of Dislocation Behavior in Low Dislocation Density, PVT-Grown, Four-Inch Silicon Carbide Single Crystals

M. Dudley, S. Byrappa, H. Wang, F. Wu, Y. Zhang, B. Raghothamachar, G. Choi, E.K. Sanchez, D. Hansen, R. Drachev, M.J. …

Materials Research Society
3 Conference Proceedings Synchrotron White Beam X-ray Topography (SWBXT) and High Resolution Triple Axis Diffraction Studies on AlN Layers Grown on 4H- and 6H-SiC Seeds

Raghothamachar, Balaji, Dudley, Michael, Dalmau, Rafael, Schlesser, Raoul, Sitar, Zlatko

Materials Research Society
9 Conference Proceedings SYNCHROTRON X-RAY TOPOGRAPHIC STUDY OF DEFECTS IN HIGH QUALITY, FLUX GROWN KTiOPO4 SINGLE CRYSTALS

Wang, S., Dudley, M., Cheng, L. K., Bierlein, J. D.

MRS - Materials Research Society
4 Conference Proceedings Synchrotron X-Ray Topography Studies of the Propagation and Post-Growth Mutual Interaction of Threading Growth Dislocations with C-Component of Burgers Vector …

F.Z. Wu, H.H. Wang, S. Byrappa, B. Raghothamachar, M. Dudley

Trans Tech Publications
10 Conference Proceedings Studies of Interface Demarcation and Structural Defects in Ga Doped Ge Single Crystals Using Synchrotron White Beam X-ray Topography

Chung, H., Raghothamachar, B., Zhou, W., Dudley, M., Gillies, D. C.

MRS - Materials Research Society
5 Conference Proceedings SYNCHROTRON WHITE RADIATION X-RAY TOPOGRAPHIC INVESTIGATION OF DISLOCATION CONFIGURATIONS DEVELOPED IN INDIUM ANTIMONIDE SINGLE CRYSTALS BY PLASTIC BENDING

Wu, Jun, Dudley, M.

MRS - Materials Research Society
11 Conference Proceedings INFLUENCE OF SURFACE RELAXATION ON X-RAY TOPOGRAPHIC IMAGING OF INTERFACIAL DISLOCATIONS IN HETEROSYSTEMS

Yao, Gong-Da, Wu, Jun, Dudley, Michael, Shastry, Vijay, Anderson, Peter

Materials Research Society
6 Conference Proceedings Crystal Growth and Defect Characterization of AlN Single Crystals

Wang, Shaoping, Raghothamachar, Balaji, Dudley, Michael, Timmerman, Adrew G.

Materials Research Society
12 Conference Proceedings Characterization of Porous SiC Substrates and of the Epilayer Structures Grown on Them

Raghothamachar, Balaji, Bai, Jie, Vetter, William M., Gouma, Perena, Dudley, Michael, Mynbaeva, Marina, Smith, Matthew …

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12