Patricio R. Lozano, Keith R. Cadwallader, Elvira Gonzalez de Mejia
American Chemical Society
|
OLIVEIRA, A.L., LEONOR, I.B., ELVIRA, C., AZEVEDO, M.C., PASKULEVA, I., EIS, R.L.
Kluwer Academic Publishers
|
|
Li, X., Lin, J., Wu, C., Wang, R., Li, Y., Jia, C.
SPIE - The International Society of Optical Engineering
|
Jong Hyun Choi, Kok Hao ChEn, Amanda Chaffee, Michael S. Strano
American Institute of Chemical Engineers
|
REUSE S., MAENHAUT C., LEFORT A., LIBERT F., PARMENTIER M., RASPE E., ROGER P., CORVILAIN B., LAURENT E., MOCKEL J., …
Springer-Verlag
|
Hasegawa, Shin, Berhow, Mark A.
American Chemical Society
|
Kamps, Jan A. A. M., Morselt, Henriette W. M., Scherphof, Gerrit L., Koning, Gerben A.
American Chemical Society
|
Chung-Hao Wang, Jen-I Hsu, Ching-An Peng
American Institute of Chemical Engineers
|
Mark A. Pinto, Charles D. Immanuel
American Institute of Chemical Engineers
|
Hilaire,P.St.
SPIE-The International Society for Optical Engineering
|
Zweibaum A., Lesuffleur T., Barbat A., Dussaulx E., Chantret I., Mahraoui L., Chevalier G., Brot-Laroche E., Rousset M.
Springer-Verlag
|