Evaluation of Single-Event Upset Tolerance on Recent Commercial Memory ICs
- Author(s):
Nemoto, N. Matsuzaki, K. Aoki, J. Akiitsu, T. Matsuda, S. Naito, I. Itoh, H. Nashiyama, I. - Publication title:
- Proceedings of the Third ESA Electronic Components Conference, EECC '97, ESTEC, Noordwijk, The Netherlands, 22-25 April 1997
- Title of ser.:
- ESA SP
- Ser. no.:
- 395
- Pub. Year:
- 1997
- Page(from):
- 461
- Page(to):
- 466
- Pages:
- 6
- Pub. info.:
- Noordwijk, The Netherlands: European Space Agency
- ISSN:
- 03796566
- ISBN:
- 9789290922636 [929092263X]
- Language:
- English
- Call no.:
- E11690/395
- Type:
- Conference Proceedings
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