Blank Cover Image

From SOI 1T-DRAMs to Unified Memory Concepts

Author(s):
Publication title:
Materials and physics of emerging nonvolatile memories : symposium held April 9-13, 2012, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
1430
Pub. Year:
2012
Page(from):
3
Page(to):
14
Pages:
12
Pub. info.:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781605114071 [1605114073]
Language:
English
Call no.:
M23500/1430
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Meta-stable dip (MSD) effect in fully-depleted SOI CMOSFETs

Bawedin, M., Yun, J.G., Cristoloveanu, S., Lee, H.D., Raynaud, C., Flandre, D.

Electrochemical Society
7 Conference Proceedings INVITED: ELECTRONIC DIVISIONAWARD ADDRESS: SOI TECHNOLOGY: THE FUTURE WILL NOT SCALE DOWN

Cristoloveanu, S.

Electrochemical Society
2 Conference Proceedings Ground-Plane Concept for Reduction of Short-Channel Effects in Fully-Depleted SOT Devices

Ernst, T, Cristoloveanu, S

Electrochemical Society
8 Conference Proceedings Influence of the Back Gate Bias on the Properties of SOI LDMOSFETs

Vandooren, A., Cristoloveanu, S.

Electrochemical Society
3 Conference Proceedings Multiple Gates for SOI MOSFETs Two, Three or Four?

S. Cristoloveanu

Electrochemical Society
9 Conference Proceedings Mobility Characterization by Magnetoresistance in Ultra Thin SOI Ring-FETs

T. V. Chandrasekhar Rao, S. Cristoloveanu, J. Antoszewski, T. Nguyen, H. Hovel, P. Genlil, L. Faraone

Electrochemical Society
4 Conference Proceedings Review of radiation effects in single- and multiple-gate SOI MOSFETs

Cristoloveanu, S.

Kluwer Academic Publishers
10 Conference Proceedings DRAM Technology for 1OOnm and Beyond *

Kusters, K.H., Alsmeier, J., Faul, J., Lutzen, J., Zell, T.

Electrochemical Society
5 Conference Proceedings Characterization and modeling of advanced SOI materials and devices

Allibert, F., Pretet, J., Ernst, T., Jomaah, J., Cristoloveanu, S.

Kluwer Academic Publishers
11 Conference Proceedings SOI Device Technology for low-power logic and DRAM LSIs

Maegawa, S., Ipposhi, T., Yamaguchi, Y., Iwamatsu, T., Maeda, S., Oashi, T., Ueda, K., Shimomura, K., Nishimura, T.

Electrochemical Society
6 Conference Proceedings INVITED: ELECTRONIC DIVISIONAWARD ADDRESS: SOI TECHNOLOGY: THE FUTURE WILL NOT SCALE DOWN

Cristoloveanu, S.

Electrochemical Society
12 Conference Proceedings Unified model of thermomechanical behavior of shape memory alloys

Naito,H., Matsuzaki,Y., Ikeda,T.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12