Blank Cover Image

Memory Retention Characteristics of Data Storage Area Written in Transition Metal Oxide Films by Using Atomic Force Microscope.

Author(s):
Publication title:
New functional materials and emerging device architectures for nonvolatile memories : symposium held April 25-29, 2011, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
1337
Pub. Year:
2011
Page(from):
85
Page(to):
90
Pages:
6
Pub. info.:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781605113142 [160511314X]
Language:
English
Call no.:
M23500/1337
Type:
Conference Proceedings

Similar Items:

K. Kinoshita, T. Makino, T. Yoda, K. Dobashi, S. Kishida

Materials Research Society

Gordon, A. E., Litfin, D. D., Hagedorn, M. S., Chen, J., Fayfield, R. T., Higman, T. K.

MRS - Materials Research Society

H. Tanaka, K. Kinoshita, M. Yoshihara, S. Kishida

Materials Research Society

Aozasa, H., Fujiwara, I., Yamauchi, K., Koyama, K., Kobayashi, T.

Electrochemical Society

T. Yoda, K. Kinoshita, T. Fukuhara, S. Kishida, N. Sawai, K. Honda

Materials Research Society

Kato, N., Park, C. S., Matsumoto, T., Kikuta, H., Iwata, K.

SPIE-The International Society for Optical Engineering

Kishida, M., Hanaoka, T., Hayashi, H., Tashiro, S., Wakabayashi, K.

Elsevier

Schaffer,T.E., Viani,M., Walters,D.A., Drake,B., Runge,E.K., Cleveland,J.P., Wendman,M.A., Hansma,P.K.

SPIE-The International Society for Optical Engineering

Heinzel,T.M., Luscher,S., Fuhrer,A., Salis,G., Held,R., Ensslin,K., Wegscheider,W., Bichler,M.

SPIE - The International Society for Optical Engineering

H. Sehgal, T. De, S. Nettikadan, M. V. Salapaka

SPIE - The International Society of Optical Engineering

Liu, D.Z., Kajiwara, S., Kikuchi, T., Shinya, N.

Trans Tech Publications

Tamiya,E., Iwabuchi,S., Hashigasako,A., Murakami,Y., Sakaguchi,T., Morita,Y., Yokoyama,K.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12