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Radiation-Induced Back Channel Leakage in 60 MeV-Proton-Irradiated 0.10μm-CMOS Partially Depleted SOI MOSFETs

Author(s):
Publication title:
Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands
Title of ser.:
ESA SP
Ser. no.:
536
Pub. date:
2004
Vol.:
536
Page(from):
425
Page(to):
432
Pages:
8
Pub. info.:
Noordwijk, the Netherlands: ESA Publication Division
ISSN:
03796566
ISBN:
9789290928461 [9290928468]
Language:
English
Call no.:
E11690/536
Type:
Conference Proceedings

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