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Focused-Ion-Beam-Assisted Bipolar Transistor Characterization and Analog Single-Event-Transient Circuit Analysis of the OP-27

Author(s):
Rowe, Jason
Massengill, Lloyd
Boulghassoul, Younes
Sternberg, Andrew
Weller, Robert
Buchner, Steve
McMorrow, Dale
Savage M
3 more
Publication title:
Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands
Title of ser.:
ESA SP
Ser. no.:
536
Pub. Year:
2004
Page(from):
133
Page(to):
140
Pages:
8
Pub. info.:
Noordwijk, the Netherlands: ESA Publication Division
ISSN:
03796566
ISBN:
9789290928461 [9290928468]
Language:
English
Call no.:
E11690/536
Type:
Conference Proceedings

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