Blank Cover Image

Thermal Penetration Times as a Non-Destructive Measure in Polyimide Films

Author(s):
N. Mathis ( Mathis Instruments, New Brunswick, Canada )  
Publication title:
Proceedings from the ninth Meeting of the Symposium on Polymers for Microelectronics at Winterthur, May 1st, 2nd, & 3rd, 2000
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2000-37
Pub. date:
2000
Page(from):
535
Page(to):
539
Pages:
5
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
Language:
English
Call no.:
E23400/200037
Type:
Conference Proceedings

Similar Items:

Mathis, N.

Electrochemical Society

Sikorsky,C., Stubbs,N., Park,S., Choi,S., Bolton,R.

SPIE - The International Society for Optical Engineering

Chandler, C., Mathis, N. E., Samuels, R. J.

MRS-Materials Research Society

Pommies, M., Damiani, D., Bertussi, B., Capoulade, J., Natoli, J. -Y., Piombini, H., Mathis, H.

SPIE - The International Society of Optical Engineering

Mathis, N.

Society of Plastics Engineers, Inc. (SPE)

Mathis N., Pytel J., Lee-Sullivan P.

Society of Plastics Engineers, Inc. (SPE)

Chandler, C., Mathis, N.

Society of Plastics Engineers

S. Hari Krishna, A. Kumar, P. Karthikeyan, M.P. Abilash, N. Narayanankutty

Trans Tech Publications

Chandler, C., Mathis, N.

Society of Plastics Engineers

Ho,K.K., Jardine,P., Carman,G.P., Kim,C.J.

SPIE-The International Society for Optical Engineering

Bolton,R., Stubbs,N., Park,S., Choi,S., Sikorsky,C.

SPIE - The International Society for Optical Engineering

Salusky, F. J.

Society of Plastics Engineers, Inc. (SPE)

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12