Blank Cover Image

Hot-Carrier Degradation of p- and n-Type Si MOSTs Stressed at Liquid Helium Temperature

Author(s):
Publication title:
Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1993-22
Pub. Year:
1993
Page(from):
30
Page(to):
39
Pages:
10
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770712 [1566770718]
Language:
English
Call no.:
E23400/932474
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Substrate Current Characteristics of Partially Depleted SOI n-MOSFETs from Room Temperature down to Liquid Helium Temperatures

Simoen, E., Claeys, C.

Electrochemical Society
7 Conference Proceedings Influence of the N-Type FinFET Width on the Zero Temperature Coefficient

M. Bellodi, J. A. Martino, L. M. Camiio, E. Simoen, C. Claeys

Electrochemical Society
2 Conference Proceedings Hot-Carrier Damage Effects on the Parameters of Random-Telegraph Signals in Small-Area MOSFETs

Simoen, E., Claeys, C.

Electrochemical Society
8 Conference Proceedings Interface defects of the new type detected by the noise method in SOI and SOS MOSFETs

Lukyanchikova, N., Petrichuk, M., Garbar, N., Simoen, E., Claeys, C.

Electrochemical Society
3 Conference Proceedings Liquid Helium Temperature Irradiation Effects on the Operation of 0.7 μm CMOS Devices for Cryogenic Space Applications

A. Mercha, Y. Creten, J. Putzeys, P. Mercken, P. De Moor, C. Claeys, C. Van Hoof, E. Simoen, A. Mohammazadeh, R. Nickson

Electrochemical Society
9 Conference Proceedings The Kink-Related Excess Noise in SOI and Bulk nMOSTs at Cryogenic Temperatures

E. Simoen, B. Dierickx, C. Claeys

Electrochemical Society
4 Conference Proceedings Impact Ionization Related Phenomena in Si MOSFETs Operated at Cryogenic Temperatures

Simoen, E., Claeys, C.

Electrochemical Society
10 Conference Proceedings Floating Body/Floating Well Effects in Deep Submicron MOSFETs at Liquid Nitrogen Temperature

Simoen, E., Hayama, K., Takakura, K., Mercha, A., Claeys, C., Ohyama, H.

Electrochemical Society
5 Conference Proceedings The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETs

Camillo, L.M., Martino, J.A., Simoen, E., Claeys, C.

Electrochemical Society
11 Conference Proceedings Impact of Irradiations Performed at Liquid Helium Temperatures on the Operation of 0.7μm CMOS Devices and Read-Out Circuits

Simoen, Eddy, Mercha, Abdelkarim, Creten, Ybe, Merken, Patrick, Putzeys, Jan, De Moor, Piet, Claeys, Cor, Van Hoof, …

ESA Publication Division
6 Conference Proceedings The impact of Fe and Cu on the minority carrier lifetime of p and n-type silicon wafers

Simoen, E., Heyns, M.M., Claeys, C., Brown, G.

Electrochemical Society
12 Conference Proceedings Simple Method to Extract the length Dependent Mobility Degradation Factor at 77 K

Nicolett, A.S., Martino, J.A., Simoen, E., Claeys, C.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12