Blank Cover Image

Reliability of High-Temperature Operation for GaN-Based OPAMP

Author(s):
Publication title:
Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
1195
Pub. Year:
2010
Page(from):
193
Page(to):
196
Pages:
4
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781605111681 [1605111686]
Language:
English
Call no.:
M23500/1195
Type:
Conference Proceedings

Similar Items:

Kazuki Nomoto, Tomo Ohsawa, Masataka Satoh, Tohru Nakamura

Materials Research Society

Taku Tajima, Satoshi Uchiumi, Kenta Tsukamoto, Kazumasa Takenaka, Masataka Satoh, Tohru Nakamura

Materials Research Society

Nomoto, Kazuki, Ito, Nobuyuki, Tajima, Taku, Kasai, Takeshi, Mishima, Tomoyoshi, Inada, taroh, Satoh, Masataka, …

Materials Research Society

Honda, Tohru, Kawanishi, Hideo

Materials Research Society

Ito, Nobuyuki, Suzuki, Akira, Kawamura, Mitsunori, Nomoto, Kazuki, Kasai, Takeshi, Mishima, Tomoyoshi, Inada, Taroh, …

Materials Research Society

Hiroshi Kambayashi, Yuki Niiyama, Takehiko Nomura, Masayuki Iwami, yoshihiro Satoh, Sadahiro Kato

Materials Research Society

Taku Tajima, Tadashi Nakamura, Yuki Watabe, Masataka Satoh, Tohru Nakamura

Materials Research Society

K. Nomoto, T. Nakamura, N. Kaneda, T. Kawano, T. Tsuchiya

Trans Tech Publications

K. Nomoto, M. Satoh, T. Nakamura

Trans Tech Publications

Z. Zhang, T. Nakamura, T. Hanada

Trans Tech Publications

Tohru Tsuruoka, Tsuyoshi Hasegawa, Kazuya Terabe, Masakazu Aono

Materials Research Society

Fukasawa, Yoshimichi, Nakamura, Tomonori, Nakamura, Tohru

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12