Scanning Kelvin Probe Microscopy of CdTe Solar Cells Measured Under Different Bias Conditions

Scanning Kelvin Probe Microscopy of CdTe Solar Cells Measured Under Different Bias Conditions

Author(s):

Publication title:

Thin-film compound semiconductor photovoltaics--2009 : symposium held April 13-17, 2009, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

1165

Pub. Year:

2010

Page(from):

361

Page(to):

366

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781605111384 [1605111384]

Language:

English

Call no.:

M23500/1165

Type:

Conference Proceedings

Details

TDL ID:	ZA00049472
Series ID:	PA00000011
Conf. info. (Name):	MRS Spring Meetin
Conf. info. (Number):	2009
Conf. info. (Venue):	San Francisco, California, USA
Conf. info. (Date):	2009.04.13-2009.04.17

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