Blank Cover Image

Characterization of amorphous/crystalline silicon interfaces from electrical measurements

Author(s):
Publication title:
Amorphous and polycrystalline thin-film silicon science and technology--2008 : symposium held March 25-28, 2008, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
1066
Pub. Year:
2008
Page(from):
75
Page(to):
86
Pages:
12
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781605110363 [1605110361]
Language:
English
Call no.:
M23500/1066
Type:
Conference Proceedings

Similar Items:

Kasouit, S., Drevillon, B., Conde, J., Kim, H.J., Kleider, J.P., Vanderhaghen, R.

SPIE-The International Society for Optical Engineering

Walton, J. T., Amman, M., Conti, G., Hong, W. S., Luke, P. N., Ziemba, F. P.

MRS - Materials Research Society

Vanderhaghen, R., Kasouit, S., Drevillon, B., Chu, V., Conde, J., Kim, H., Kleider, J.P.

SPIE-The International Society for Optical Engineering

Crabbe, E.. F., Hoyt, J. L., Pease, R. F. W., Gibbons, J. F.

Materials Research Society

McCann, P., MeKeever, J., Nicholson, D., Ruddell, F., Gamble, H.S., Nevin, W.A.

Electrochemical Society

Hung, L.S., Wang, S.Q., Mayer, J.W., Saris, F.W.

Materials Research Society

Dimitrakis, P., Papaioannou, G.J., Cristoloveanu, S.

Electrochemical Society

Essick, J.M., Mather, R.T., Bennett, M.S., Newton, J.

Materials Research Society

Volz, M. P., Bork, B. P., Fedders, P. A., Norberg, R. E., Bowman, Jr., R. C., Maeland, A. J., Cantrell, J. S.

Materials Research Society

Williams, J.S., Thornton, R.P., Elliman, R.G., Li, Y.H., Pogany, A.P.

Materials Research Society

Vetrella, U.B., Cohen, J.D.

Materials Research Society

Borzi, R., Cull, T. S., Fedders, P. A., Leopold, D. J., Norberg, R. E., Boyce, J. B., Johnson, N. M., Ready, S. E., …

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12