STM Characterization of Low Dimensional Surface Electronic Properties of Undoped Diamond in Buffer Solutions

STM Characterization of Low Dimensional Surface Electronic Properties of Undoped Diamond in Buffer Solutions

Author(s):

Publication title:

Diamond electronics-fundamentals to applications II : symposium held November 26-30, 2007, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

1039

Pub. Year:

2007

Page(from):

77

Page(to):

82

Pages:

6

Pub. info.:

Warrendale: Materials Research Society

ISSN:

02729172

ISBN:

9781558999862 [1558999868]

Language:

English

Call no.:

M23500/1039

Type:

Conference Proceedings

Details

TDL ID:	ZA00049364
Series ID:	PA00000011
Conf. info. (Name):	Materials Research Society meeting ; Symposium on diamond electronics-fundamentals to applications
Conf. info. (Number):	2007 ; 2nd
Conf. info. (Venue):	Boston, Massachusetts, USA
Conf. info. (Date):	2007.11.26-2007.11.30

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