Probabilistic Analysis of Notched Micro Specimen Under Three-Point Loading

Probabilistic Analysis of Notched Micro Specimen Under Three-Point Loading

Author(s):

Publication title:

ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference (IDETC/CIE2005)

Title of ser.:

ASME Symposia Volumes

Ser. no.:

DETC 2005(4)

Pub. Year:

2005

Vol.:

4

Paper no.:

DETC2005-85493

Page(from):

717

Page(to):

726

Pages:

10

Pub. info.:

New York, N.Y.: American Society of Mechanical Engineers

ISBN:

9780791847411 [0791847411]

Language:

English

Call no.:

A11633/2005

Type:

Conference Proceedings

Details

TDL ID:	ZA00048598
Series ID:	PA00000270
Conf. info. (Name):	ASME International Design Engineering Technical Conference ; Computers and Information in Engineering Conference ; ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications ; Design for Manufacturing and the Life Cycle Conference ; Reliability, Stress Analysis and Failure Prevention Conference
Conf. info. (Number):	2005 ; 2005 ; 2005 ; 2005 ; 18th
Conf. info. (Venue):	Long Beach, California USA
Conf. info. (Date):	2005.09.24-2005.09.28

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