Blank Cover Image

Eigenvalue and Eigenvector Information of Graphs and Their Validity in Detection of Graph Isomorphism

Author(s):
Publication title:
27th Biennial Mechanisms and Robotics Conference
Title of ser.:
ASME Symposia Volumes
Ser. no.:
DETC 2002(5A)
Pub. Year:
2002
Vol.:
5A
Paper no.:
DETC2002/MECH-34247
Page(from):
421
Page(to):
428
Pages:
8
Pub. info.:
New York, N.Y.: American Society of Mechanical Engineers
ISBN:
9780791836538 [0791836533]
Language:
English
Call no.:
A11633/2002
Type:
Conference Proceedings

Similar Items:

Ragothaman, P., Mikhael, B. W., Muise, R., Mahalanobis, A., Yang, T.

SPIE - The International Society of Optical Engineering

Yuan, Y., He, Q., Zhang, J., Mu, G.

SPIE-The International Society for Optical Engineering

W. Huang, J. Wang, J. Yang, H. Zhang, P. Chen

Society of Photo-optical Instrumentation Engineers

Li, C., Li, Y., Wu, R., Li, Q., Zhuang, Q., Zhang, Z.

SPIE - The International Society of Optical Engineering

Reinhardt,J.M., Park,W., Hoffman,E.A., Sonka,M.

SPIE-The International Society for Optical Engineering

J. Mao, T. He, X. Li, X. Liu, Q. Zeng

SPIE - The International Society of Optical Engineering

Gao, X., Li, Q., Li, J.

SPIE - The International Society of Optical Engineering

G. Wang, J. He, W. Li, J. Wang, S. Li

Society of Photo-optical Instrumentation Engineers

L. Li, X. Zhang, Q. Yu, H. Zhang

SPIE - The International Society of Optical Engineering

Q. Zhou, C. Zhang, W. -W. Li, K. Mu, R. Feng

Society of Photo-optical Instrumentation Engineers

Li, Q., Zhang, J., Huang, J., Xie, Z.

SPIE - The International Society of Optical Engineering

Y. Liu, J.F. Leng, Z.W. Li, P.Y. Zhang, Q.R. Wu

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12