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Predicting Product Cosmetic Quality Using Virtual Environments

Author(s):
John Maxfield
Neal P. Juster
Peter M. Dew
Stephen Taylor
Martin Fitchie
William J. Ion
Jeff Zhao
Martin Thompson
3 more
Publication title:
20th Computers and Information in Engineering Conference
Title of ser.:
ASME Symposia Volumes
Ser. no.:
DETC 2000(1)
Pub. Year:
2000
Vol.:
1
Paper no.:
DETC2000/CIE-14591
Page(from):
747
Page(to):
756
Pages:
10
Pub. info.:
New York, N.Y.: American Society of Mechanical Engineers
ISBN:
9780791835111 [0791835111]
Language:
English
Call no.:
A11633/2000
Type:
Conference Proceedings

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