Blank Cover Image

Stress-Induced Leakage Current in Magnetic Tunnel Junctions with Thin AlOx Barrier

Author(s):
Publication title:
Silicon nitride, silicon dioxide, and emerging dielectrics 9
Title of ser.:
ECS transactions
Ser. no.:
6(3)
Pub. Year:
2007
Page(from):
343
Page(to):
354
Pages:
12
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566775526 [1566775523]
Language:
English
Call no.:
E23400/6-3
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Extraction of the Density of Interface Trap States in Thin-Film Transistors

H. Tsuji, Y. Kamakura, K. Taniguchi

Electrochemical Society
7 Conference Proceedings A study of trap profiles in thin silicon dioxide films at dielectric breakdown using percolation model

Uno, S., Ishida, A., Okada, K., Sakura, T., Deguchi, K., Kamakura, Y., Taniguchi, K.

MRS-Materials Research Society
2 Conference Proceedings Annealing-Induced Solid-Phase Epitaxy at Interfaces between CoFeB Layers and MgO Barrier-Layer in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions and Their Magnetic …

Y. Kitamoto, T. Takeuchi, K. Tsunekawa, Y. Choi, Y. Nagamine

Electrochemical Society
8 Conference Proceedings Analysis of High Leakage Currents in 4H-SiC Schottky Barrier Diodes Using Optical Beam-Induced Current Measurements

Tsuji, T., Izumi, S., Ueda, A., Fujisawa, H., Ueno, K., Tsuchida, H., Kamata, I., Jikimoto, T., Izumi, K.

Trans Tech Publications
3 Conference Proceedings XPS Analysis of Thin Insulating Barriers in Magnetic Tunnel Junctions

Batlle, X., Hattink, B.J., Labarta, A., Joesson-Åkerman, B.J., Escudero, R., Schuller, I.K.

Kluwer Academic Publishers
9 Conference Proceedings Analysis of High Leakage Currents in 4H-SiC Schottky Barrier Diodes Using Optical Beam-Induced Current Measurements

Tsuji, T., Izumi, S., Ueda, A., Fujisawa, H., Ueno, K., Tsuchida, H., Kamata, I., Jikimoto, T., Izumi, K.

Trans Tech Publications
4 Conference Proceedings Unusual I/V characteristics of Nb/Al/AlOx/Al/AlOx/Nb SINIS tunnel junctions

Nevirkovets,I.P., Ketterson,J.B., Rowell,J.M.

SPIE - The International Society for Optical Engineering
10 Conference Proceedings Optimum Design of a SiC Schottky Barrier Diode Considering Reverse Leakage Current due to a Tunneling Process

Hatakeyama, T., Kushibe, M., Watanabe, T., Imai, S., Shinohe, T.

Trans Tech Publications
5 Conference Proceedings Magnetic Tunnel Junctions With Low Resistance, High Current Density, and Good Uniformity

Tsuge, H., Mitsuzuka, T., Kamijo, A., Matsuda, K.

MRS - Materials Research Society
11 Conference Proceedings Quantitative analysis of SlLCs(stress-induced leakage currents)based on the inelastic trap-assisted tunneling model

Kamohara,S., Okuyama,Y., Manabe,Y., Okuyama,K., Kubota,K., Park,D., Hu,C.

SPIE - The International Society for Optical Engineering
6 Conference Proceedings 4.5 kV SiC Junction Barrier Schottky Diodes with Low Leakage Current and High Forward Current Density

J. Schoeck, J. Buettner, M. Rommel, T. Erlbacher, A.J. Bauer

Trans Tech Publications
12 Conference Proceedings Study of stress-induced leakage current in thin oxides stressed by corona charging in air: Relationship to GOI defects

Wilson, M., Lagowski, J., Savtchou, A., Marinskiy, D., Jastrzebski, L., D'Amico, J.

MRS-Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12