Toward Understanding the Wide Distribution of Time Scales in Negative Bias Temperature Instability

Toward Understanding the Wide Distribution of Time Scales in Negative Bias Temperature Instability

Author(s):

Publication title:

Silicon nitride, silicon dioxide, and emerging dielectrics 9

Title of ser.:

ECS transactions

Ser. no.:

6(3)

Pub. Year:

2007

Page(from):

265

Page(to):

282

Pages:

18

Pub. info.:

Pennington, N.J.: Electrochemical Society

ISSN:

19385862

ISBN:

9781566775526 [1566775523]

Language:

English

Call no.:

E23400/6-3

Type:

Conference Proceedings

Details

TDL ID:	ZA00047127
Series ID:	PA00000034
Conf. info. (Name):	Symposium on Silicon Nitride, Silicon Dioxide Thin Insulating Films, and Emerging Dielectrics ; Meeting of The Electrochemical Society
Conf. info. (Number):	9th ; 211th
Conf. info. (Venue):	Chicago, IL, USA
Conf. info. (Date):	2007.05.06-2007.05.11

Similar Items:

1 Conference Proceedings *Impact of temperature and breakdown statistics on reliability predictions for ultrathin oxides Groeseneken, G., Degraeve, R., Kaczer, B., Maes, H. E. MRS-Materials Research Society	7 Conference Proceedings A Step Towards a Better Understanding of Silicon Passivated (100)Ge p- Channel Devices G. Pourtois, M Houssa, B. De Jaeger, F. Leys, B. Kaczer, K. Martens, M. Caymax, M. Meuris, G. Groeseneken, M. Heyns Electrochemical Society
2 Conference Proceedings Analysis of Short-channel MOSFET Behavior after Gate Oxide Breakdown and its Impact on Digital Circuit Reliability Groeseneken, G., Kaczer, B., Degraeve, R. Electrochemical Society	8 Conference Proceedings Hydrogen Model for Negative Bias Temperature Instabilities in MOS Gate Dielectrics Fleetwood, D.M., Zhou, X.J., Tsetseris, L., Pantelides, S.T., Schrimpf, R.D. Electrochemical Society
3 Conference Proceedings Present Reliability Issues in Ultrathin Oxynitride Films Kaczer, B, Degraeve, R., Arkhipov, V., Groeseneken, G. Electrochemical Society	9 Conference Proceedings Negative Bias Temperature Instability of SiC MOSFET C.T. Yen, H.T. Hung, C.C. Hung, C.Y. Lee, H.Y. Lee Trans Tech Publications
4 Conference Proceedings INVITED: ELECTRIC STRESS-INDUCED DEGRADATION OF THIN OXIDE LAYERS AND ITS IMPACT ON DEVICE RELIABILITY Degraeve, R., Kaczer, B., Roussel, Ph., Groeseneken, G. Electrochemical Society	10 Conference Proceedings Efficient Characterization of Threshold Voltage Instabilities in SiC nMOSFETs Using the Concept of Capture-Emission-Time Maps G. Pobegen, T. Grasser Trans Tech Publications
5 Conference Proceedings INVITED: ELECTRIC STRESS-INDUCED DEGRADATION OF THIN OXIDE LAYERS AND ITS IMPACT ON DEVICE RELIABILITY Degraeve, R., Kaczer, B., Roussel, Ph., Groeseneken, G. Electrochemical Society	11 Conference Proceedings Hot Carrier Stress and Breakdown Impact on High-frequency MOSFET Analog Performance Pantisano, L., Schreurs, D., Kaczer, B., Simoen, E., Groeseneken, G. Electrochemical Society
6 Conference Proceedings Threshold Voltage Instabilities of Present SiC-Power MOSFETs under Positive Bias Temperature Stress G. Rescher, G. Pobegen, T. Grasser Trans Tech Publications	12 Conference Proceedings Interface Trap Characterization and Fermi Level Pinning in Si-Passivated Ge/HfO₂ Capacitors K. Martens, B. Kaczer, P. Roussel, G. Groeseneken, H. Maes Electrochemical Society

1

2

3

4

5

6

7

8

9

10

11

12