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Reduced Parameter Fluctuation with Laser and Flash Lamp Anneal for 65nm Volume Production

Author(s):
T. Feudel
B. Bayha
G. Burbach
M. Gerhardt
L. Herrmann
M. Herden
T. Mantei
E. Ehrichs
M. Greenlaw
M. Horstmann
5 more
Publication title:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment
Title of ser.:
ECS transactions
Ser. no.:
6(1)
Pub. date:
2007
Page(from):
373
Page(to):
380
Pages:
8
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
19385862
ISBN:
9781566775502 [1566775507]
Language:
English
Call no.:
E23400/6-1
Type:
Conference Proceedings

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