Analysis of Self-Heating Effect in Graded-Channel Silicon-on-Insulator nMOSFETS

Analysis of Self-Heating Effect in Graded-Channel Silicon-on-Insulator nMOSFETS

Author(s):

Publication title:

Microelectronics Technology and Devices : SBMICRO 2006

Title of ser.:

ECS transactions

Ser. no.:

4(1)

Pub. Year:

2006

Page(from):

257

Page(to):

264

Pages:

8

Pub. info.:

Pennington, N.J.: Electrochemical Society

ISSN:

19385862

ISBN:

9781566775120 [1566775124]

Language:

English

Call no.:

E23400/4-1

Type:

Conference Proceedings

Details

TDL ID:	ZA00047123
Series ID:	PA00000034
Conf. info. (Name):	International Symposium on Microelectronics Technology and Devices : SBMicro
Conf. info. (Number):	21th : 2006
Conf. info. (Venue):	Ouro Preto, MG, Brazil
Conf. info. (Date):	2006.08.28-2006.09.01

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