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Evaluation of Triple-Gate Finfets with High-k Dielectrics and TiN Gate Material Under Analog Operation

Author(s):
Marcelo Pavanello
Joao Martino
Eddy Simoen
Rita Rooyackers
Nadine Collaert
Cor Claeys
1 more
Publication title:
Microelectronics Technology and Devices : SBMICRO 2006
Title of ser.:
ECS transactions
Ser. no.:
4(1)
Pub. Year:
2006
Page(from):
237
Page(to):
246
Pages:
10
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566775120 [1566775124]
Language:
English
Call no.:
E23400/4-1
Type:
Conference Proceedings

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