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Oxide Dielectrics for Reliable Passivation of AlGaN/GaN HEMTs and Insulated Gates

Author(s):
B. Gila
M. Hlad
T. Anderson
J. Chen
K. Allums
A. Gerger
A. Herrero
S. Jang
B. Kang
C. R. Abernathy
F. Ren
S. J. Pearton
7 more
Publication title:
State-of-the-art program on compound semiconductors 45 (SOTAPOCS 45) and wide bandgap semiconductor materials and devices 7
Title of ser.:
ECS transactions
Ser. no.:
3(5)
Pub. date:
2006
Page(from):
141
Page(to):
150
Pages:
10
Pub. info.:
Pennington, N.J: Electrochemical Society
ISSN:
19385862
ISBN:
9781566775052 [1566775051]
Language:
English
Call no.:
E23400/3-5
Type:
Conference Proceedings

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