Evaluation of Trisilylamine for HfSiO x Atomic Layer Deposition
- Author(s):
- Publication title:
- Physics and technology of high-k gate dielectrics 4
- Title of ser.:
- ECS transactions
- Ser. no.:
- 3(3)
- Pub. Year:
- 2006
- Page(from):
- 441
- Page(to):
- 448
- Pages:
- 8
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 19385862
- ISBN:
- 9781566775038 [1566775035]
- Language:
- English
- Call no.:
- E23400/3-3
- Type:
- Conference Proceedings
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