Blank Cover Image

Triple Gate FinFET Parameter Extraction Using High Frequency Capacitance - Voltage Curves

Author(s):
Publication title:
Microelectronics Technology and Devices : SBMICRO 2007
Title of ser.:
ECS transactions
Ser. no.:
9(1)
Pub. date:
2007
Page(from):
9
Page(to):
18
Pages:
10
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566775656 [1566775655]
Language:
English
Call no.:
E23400/9-1
Type:
Conference Proceedings

Similar Items:

M. Rodrigues, V. Sonnenberg, J.A. Martino

Electrochemical Society

R. Giacomini, J. A. Martino

Electrochemical Society

C.D. Santos, J.A. Martino

Electrochemical Society

M. A. Pavanello, J. A. Martino, E. Simoen, R. Rooyackers, N. Collaert, C. Claeys

Electrochemical Society

Rodrigues, M., Sonnenberg, V., Martino, J. A.

Electrochemical Society

R. Giacomini, J. A. Martino, M. A. Pavanello

Electrochemical Society

Sonnenberg, V., Martino, J.A.

Electrochemical Society

Sonnenberg, V., Martino, J.A.

Electrochemical Society

Michele Rodrigues, Victor Sonnenberg, João Antonio Martino

Electrochemical Society

Marcelo Pavanello, Joao Martino, Eddy Simoen, Rita Rooyackers, Nadine Collaert, Cor Claeys

Electrochemical Society

M.A. Pavanello, J.A. Martino, E. Simoen, R. Rooyackers, N. Collaert

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12