Blank Cover Image

MANAGEMENT OF METALLIC CONTAMINATION IN ADVANCED IC MANUFACTURING

Author(s):
A. Danel
D. Renaud
P. Besson
C. Bigot
A. Groujilet
J. P. Joly
M. Claes
T. Bearda
J. Frickinger
4 more
Publication title:
Cleaning Technology in Semiconductor Device Manufacturing IX
Title of ser.:
ECS transactions
Ser. no.:
1(3)
Pub. Year:
2006
Page(from):
3
Page(to):
10
Pages:
8
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
19385862
ISBN:
9781566774291 [1566774292]
Language:
English
Call no.:
E23400/1-3
Type:
Conference Proceedings

Similar Items:

A. Danel, Y. Borde, A. Maurel, B. Laetitia, A. Royer

Electrochemical Society

Y. Borde, A. Maurel, A. Danel, A. Roche, M. Veillerot

Electrochemical Society

Bigot, C., Fontaine, H., Danel, A.

Electrochemical Society

Claes, M., De Gendt, S.

Electrochemical Society

Tower,J.P., Kamieniecki,E., Nguyen,M.C., Danel,A.

SPIE - The International Society for Optical Engineering

Fyen, W., Holsteyns, F., Lauerhaas, J., Bearda, T., Mertens, P., Heyns, M.

Electrochemical Society

Tardif, F., Raccurt, O., Barbe, J.C., De Crecy, F., Besson, P., Danel, A.

Electrochemical Society

Bugler,J., Frickinger,J., Zielonka,G., Pfitzner,L., Ryssel,H., Schottler,M.

SPIE-The International Society for Optical Engineering

Walz, D., Joly, J.P., Kamarinos, G., Barla, K.

Electrochemical Society

C. Bigot, M. C. Nguyen, A. Danel

Electrochemical Society

Kwakman, L.F.T., Delille, D., Mermoux, M., Crisci, A., Lucazeau, G.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12