Blank Cover Image

Thermal Stability of LaOx/Si Interfacial Transition Layer

Author(s):
H. Nohira
T. Yoshida
H. Okamoto
W. Sakai
K. Nakajima
M. Suzuki
K. Kimura
N. J. Aun
Y. Kobayashi
S. Obmi
H. Iwai
E. Ikenaga
K. Kobayashi
Y. Takata
T. Hattori
10 more
Publication title:
Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5
Title of ser.:
ECS transactions
Ser. no.:
1(1)
Pub. Year:
2005
Page(from):
87
Page(to):
96
Pages:
10
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566774307 [1566774306]
Language:
English
Call no.:
E23400/1-1
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Annealing-temperature Dependence of Compositional Depth Profile and Chemical Structures of LaOx/ScOx/Si and ScOx/LaOx/Si Interfacial Transition Layer

H. Nohira, Y. Takenaga, K. Kakushima, P. Ahmet, K. Tsutsui

Electrochemical Society
7 Conference Proceedings Detection of interfaces states correlated with layer-by-layer oxidation on Si(100)

Hattori, T., Nohira, H., Teramoto, Y., Watanabe, N.

MRS-Materials Research Society
2 Conference Proceedings Angle-Resolved Photoelectron Spectroscopy Study on Gate Insulators

T. Hattori, K. Kakushima, K. Nakajima, H. Nohira, K. Kimura, H. Iwai

Electrochemical Society
8 Conference Proceedings Magnetic-Force-Microscopy Analysis of Thermal Stability in Longitudinal Media

Abarra, E. N., Okamoto, I., Suzuki, T.

MRS - Materials Research Society
3 Conference Proceedings Characterization of Oxide Films on SiC Epitaxial (0001) Faces by Angle-Resolved Photoemission Spectroscopy Measurements Using Synchrotron Radiation

Hijikata, Y., Yaguchi, H., Yoshida, S., Takata, Y., Kobayashi, K., Shin, S., Nohira, H., Hattori, T.

Trans Tech Publications
9 Conference Proceedings ELTRAN by Splitting Porous Si Layers

Sakaguchi, K, Yanagita, Y, Kurisu, H, Suzuki, H, Obmi, K, Yonehara, T

Electrochemical Society
4 Conference Proceedings Off-Angle Dependence of Characteristics of 4H-SiC-Oxide Interfaces

Hijikata, Y., Yaguchi, H., Yoshida, S., Takata, Y., Kobayashi, K., Nohira, H., Hattori T.

Trans Tech Publications
10 Conference Proceedings Angle-Resolved Photoelectron Spectroscopy Study on Ultrathin Gate Dielectrics

H. Nohira, T. Hattori

Electrochemical Society
5 Conference Proceedings Effect of Deposition Temperature on Chemical Structure of Lanthanum Oxide/Si Interface Structure

H. Nohira, T. Matsuda, K. Tachi, Y. Shiino, J. Song, Y. Kuroki, J. Ng, P. Ahmet, K. Kakushima, K. Tsutsui, E. Ikenaga, …

Electrochemical Society
11 Conference Proceedings La₂O₃ Gate Dielectric Thin Film with Sc₂O₃ Buffer Layer for High Temperature Annealing

Y. Shiino, K. Kakushima, P. Ahmet, K. Tsutsui, N. Sugil, T. Hattori, H. Iwai

Electrochemical Society
6 Conference Proceedings High-Resolution X-Ray Photoelectron Spectroscopy Study on Si₃N₄/Si Interface Structures and Its Correlation with Hysteresis in C(V) Curves

M. Higuchi, A. Teramoto, M. Komura, S. Shinagawa, E. Ikenaga, H. Nohira, K. Kobayashi, T. Hattori, S. Sugawa, T. Ohmi

Electrochemical Society
12 Conference Proceedings Development of Highly Active Co-Mo Catalyst for Ultra-deep Desulfurization of Diesel Fractions

N. Nakajima, H. Kimura, K. Kiriyama, T. Fujikawa, T. Kubota, Y. Okamoto

Elsevier
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12