Understanding Metastable Defect Creation in CIGS by Detailed Device Modeling and Measurements on Bifacial Solar Cells

Understanding Metastable Defect Creation in CIGS by Detailed Device Modeling and Measurements on Bifacial Solar Cells

Author(s):

Publication title:

Thin-film compound semiconductor photovoltaics--2007

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

1012

Pub. Year:

2007

Page(from):

223

Page(to):

228

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558999725 [1558999728]

Language:

English

Call no.:

M23500/1012

Type:

Conference Proceedings

Details

TDL ID:	ZA00048535
Series ID:	PA00000011
Conf. info. (Name):	MRS Spring Meeting
Conf. info. (Number):	2007
Conf. info. (Venue):	San Francisco, California
Conf. info. (Date):	2007.04.09-2007.04.13

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